k-Space Associates, Inc. specializes in real-time, in-situ, thin-film metrology tools for MBE, MOCVD, PVD, PLD, sputtering, and thermal evaporation. Applications include R&D and production line monitoring of compound semiconductor-based electronic, optoelectronic, and photovoltaic devices.
Our suite of products allows for real-time monitoring and control of temperature, stress, film thickness, deposition rate, surface roughness, optical absorption, band edge, and optical constants. Our kSA 400 is the most powerful analytical RHEED system available on the market today. We also supply a host of ex-situ wafer and surface analysis tools, including the kSA MOS UltraScan and Thermal Scan systems, which perform full curvature, stress, and wafer bow mapping on up to 12” wafers.
Products & Services
- Thin film measurement
- Thin Film Thickness Gauges
- Thin film thickness measurement
Brand Name Products
No brand name products listed for k-Space Associates, Inc..
You can click here to send enquiry: Send Enquiry